GGB-ECP series probe
The ECP probes are great for testing devices that have large pads or bumps, such as PCB's or BGA's, and for devices that non-planar surfaces.
The Model ECP18 and Model ECP40 Picoprobes have independently mobing BeCu tips-the groud tips and the signal tip move up and down on the Z-axis
independent of each other.

Features
• The tips are flat and square and look like 50um tall posts hanging off the 0.047" coax.
• For any pitch up to 250um, the contact area of each tip is approximately 40x40um;
• 75x75um for any pitch from 275um to 600um; and 150x150um for any pitch from 625um to 3000um.
• As the tips wear from use, the size of the contact area (ie: 40x40um) remains the same
• 25 x 25 µm is also available.
Specification